Patent Assignment Details
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| Reel/Frame: | 017250/0728 | |
| Pages: | 2 |
| | Recorded: | 03/03/2006 | | |
| Attorney Dkt #: | PPW05-028DS |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/11/2007
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Application #:
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11324168
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Filing Dt:
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12/29/2005
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Publication #:
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Pub Dt:
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07/06/2006
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Title:
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COMPOSITE PATTERN FOR MONITORING VARIOUS DEFECTS OF SEMICONDUCTOR DEVICE
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Assignee
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| 891-10, DAECHI-DONG, GANGNAM-GU |
| SEOUL, KOREA, REPUBLIC OF 135-280 |
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Correspondence name and address
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ANDREW D. FORTNEY
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7257 N. MAPLE AVE, SUITE 107
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FRESNO, CA 93720
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