Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 013215/0734 | |
| Pages: | 5 |
| | Recorded: | 08/14/2002 | | |
| Conveyance: | CORRECTED RECORDATION FORM COVERSHEET TO CORRECT ASSIGNOR'S NAME, PREVIOUSLY RECORDED AT REEL/FRAME 012814/0079 (ASSIGNMENT OF ASSIGNOR'S INTEREST) |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/04/2003
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Application #:
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10032334
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Filing Dt:
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12/18/2001
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Publication #:
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Pub Dt:
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10/24/2002
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Title:
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CONTROL OF AMOUNT AND UNIFORMITY OF OXIDATION AT THE INTERFACE OF AN EMITTER REGION OF A MONOCRYSTALLINE SILICON WAFER AND A POLYSILICON LAYER FORMED BY CHEMICAL VAPOR DEPOSITION
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Assignee
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| VIA C. OLIVETTI, 2 |
| 20041 AGRATE BRIANZA, ITALY |
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Correspondence name and address
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ALLEN, DYER, DOPPLET, ET AL.
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CHRISTOPHER F. REGAN, ESQ.
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255 S. ORANGE AVENUE
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P.O. BOX 3791
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ORLANDO, FL 32802
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