Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 018168/0738 | |
| Pages: | 5 |
| | Recorded: | 08/04/2006 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
Total properties:
1
|
|
Patent #:
|
|
Issue Dt:
|
11/03/2009
|
Application #:
|
10588636
|
Filing Dt:
|
08/04/2006
|
Publication #:
|
|
Pub Dt:
|
11/15/2007
| | | | |
Title:
|
SEMICONDUCTOR DEVICE TEST APPARATUS AND METHOD
|
|
Assignee
|
|
|
1-32-1, ASAHI-CHO, NERIMA-KU |
TOKYO, JAPAN |
|
Correspondence name and address
|
|
DAVID N. LATHROP, ESQUIRE
|
|
GALLAGHER & LATHROP
|
|
A PROFESSIONAL CORPORATION
|
|
601 CALIFORNIA STREET, SUITE 1111
|
|
SAN FRANCISCO, CA 94108-2805
|
Search Results as of:
06/01/2024 12:40 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|