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Patent Assignment Details

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Reel/Frame:	037391/0741			Pages:	11
		Recorded:	12/31/2015
Conveyance:	MERGER (SEE DOCUMENT FOR DETAILS).

Total properties: 16

Patent #:	7383149	Issue Dt:	06/03/2008	Application #:	11637280	Filing Dt:	12/12/2006
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	8049145	Issue Dt:	11/01/2011	Application #:	11708174	Filing Dt:	02/20/2007
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	7603249	Issue Dt:	10/13/2009	Application #:	11708184	Filing Dt:	02/20/2007
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	7535786	Issue Dt:	05/19/2009	Application #:	11708185	Filing Dt:	02/20/2007
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	7480588	Issue Dt:	01/20/2009	Application #:	11708408	Filing Dt:	02/20/2007
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	7760570	Issue Dt:	07/20/2010	Application #:	11708733	Filing Dt:	02/21/2007
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	7720627	Issue Dt:	05/18/2010	Application #:	12150091	Filing Dt:	04/24/2008
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	7654736	Issue Dt:	02/02/2010	Application #:	12315521	Filing Dt:	12/04/2008
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	7639548	Issue Dt:	12/29/2009	Application #:	12391764	Filing Dt:	02/24/2009
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	8005641	Issue Dt:	08/23/2011	Application #:	12540446	Filing Dt:	08/13/2009
Publication #:	US20110037138	Pub Dt:	02/17/2011
Title:	TEMPERATURE SENSING CIRCUIT WITH HYSTERESIS AND TIME DELAY

Patent #:	8040742	Issue Dt:	10/18/2011	Application #:	12635533	Filing Dt:	12/10/2009
Publication #:	US20110044118	Pub Dt:	02/24/2011
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	8308359	Issue Dt:	11/13/2012	Application #:	12688662	Filing Dt:	01/15/2010
Publication #:	US20110044372	Pub Dt:	02/24/2011
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	7953573	Issue Dt:	05/31/2011	Application #:	12753411	Filing Dt:	04/02/2010
Publication #:	US20110044119	Pub Dt:	02/24/2011
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	8081532	Issue Dt:	12/20/2011	Application #:	12793845	Filing Dt:	06/04/2010
Publication #:	US20110046912	Pub Dt:	02/24/2011
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Patent #:	8497453	Issue Dt:	07/30/2013	Application #:	13235754	Filing Dt:	09/19/2011
Publication #:	US20120008447	Pub Dt:	01/12/2012
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE

Patent #:	9766135	Issue Dt:	09/19/2017	Application #:	13490890	Filing Dt:	06/07/2012
Publication #:	US20120243574	Pub Dt:	09/27/2012
Title:	SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD

Assignor

Exec Dt:

08/26/2015

Assignee

2711 CENTERVILLE RD

SUITE 400

WILMINGTON, DELAWARE 19808

Correspondence name and address
	FOLEY & LARDNER LLP
	150 EAST GILMAN STREET
	VEREX PLAZA
	MADISON, WI 53703

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