Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 063537/0745 | |
| Pages: | 3 |
| | Recorded: | 05/04/2023 | | |
| Attorney Dkt #: | PK1866182 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
18312177
|
Filing Dt:
|
05/04/2023
|
|
Publication #:
|
|
Pub Dt:
|
04/25/2024
| | | | |
|
Title:
|
OVERLAY MARK FORMING MOIRE PATTERN, OVERLAY MEASUREMENT METHOD USING SAME, OVERLAY MEASUREMENT APPARATUS USING SAME, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING SAME
|
|
|
Assignee
|
|
|
|
|
| #15-23, DONGTANSANDAN 6-GIL, DONGTAN-MYEON |
| HWASEONG-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 18487 |
|
|
Correspondence name and address
|
| |
NOVICK, KIM & LEE
|
| |
3251 BLENHEIM BLVD, SUITE 500
|
| |
FAIRFAX, VA 22030
|
Search Results as of:
05/31/2024 08:06 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
