Patent Assignment Details
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| Reel/Frame: | 063988/0756 | |
| Pages: | 10 |
| | Recorded: | 06/20/2023 | | |
| Attorney Dkt #: | TSMCP913USC |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18337470
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Filing Dt:
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06/20/2023
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Publication #:
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Pub Dt:
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10/19/2023
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Title:
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SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING EXTERNAL MAGNETIC FIELD WAFER TESTING
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Assignee
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| NO. 8, LI-HSIN RD. 6 |
| HSIN-CHU SCIENCE PARK |
| HSIN-CHU, TAIWAN 300-77 |
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Correspondence name and address
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ESCHWEILER & POTASHNIK
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3500 MASSILLON ROAD, SUITE 420
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UNIONTOWN, OH 44685
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