Total properties:
11
|
|
Patent #:
|
|
Issue Dt:
|
06/07/1994
|
Application #:
|
07923901
|
Filing Dt:
|
08/20/1992
|
Title:
|
CRYOGENIC COOLING APPARATUS
|
|
|
Patent #:
|
|
Issue Dt:
|
12/23/1997
|
Application #:
|
08416895
|
Filing Dt:
|
04/12/1995
|
Title:
|
MAGNET ARRANGEMENT, AND DRIVE DEVICE AND COOLING APPARATUS INCORPORATING SAME
|
|
|
Patent #:
|
|
Issue Dt:
|
09/17/2002
|
Application #:
|
09367446
|
Filing Dt:
|
11/29/1999
|
Title:
|
CHARGED PARTICLE ANALYSIS
|
|
|
Patent #:
|
|
Issue Dt:
|
05/01/2007
|
Application #:
|
10181365
|
Filing Dt:
|
10/23/2002
|
Publication #:
|
|
Pub Dt:
|
05/29/2003
| | | | |
Title:
|
LIPOPROTEIN ASSAY
|
|
|
Patent #:
|
|
Issue Dt:
|
02/24/2004
|
Application #:
|
10332654
|
Filing Dt:
|
05/05/2003
|
Publication #:
|
|
Pub Dt:
|
09/11/2003
| | | | |
Title:
|
NANOSTRUCTURES
|
|
|
Patent #:
|
|
Issue Dt:
|
06/19/2007
|
Application #:
|
10478159
|
Filing Dt:
|
06/29/2004
|
Publication #:
|
|
Pub Dt:
|
12/09/2004
| | | | |
Title:
|
METHOD OF DETERMINING CRYSTALLIZATION
|
|
|
Patent #:
|
|
Issue Dt:
|
06/13/2006
|
Application #:
|
10495613
|
Filing Dt:
|
11/12/2004
|
Publication #:
|
|
Pub Dt:
|
03/31/2005
| | | | |
Title:
|
METHOD AND APPARATUS FOR OBTAINING SIMULTANEOUSLY ABSORPTION AND REFRACTION IMAGES BY USE OF A MONOCHROMATOR WITH INTEGRATED RADIATION DETECTOR
|
|
|
Patent #:
|
|
Issue Dt:
|
01/20/2009
|
Application #:
|
10543803
|
Filing Dt:
|
07/29/2005
|
Publication #:
|
|
Pub Dt:
|
08/31/2006
| | | | |
Title:
|
CIRCULAR DICHROISM DETECTION SYSTEM
|
|
|
Patent #:
|
|
Issue Dt:
|
07/21/2009
|
Application #:
|
10558699
|
Filing Dt:
|
11/30/2005
|
Publication #:
|
|
Pub Dt:
|
11/09/2006
| | | | |
Title:
|
TOMOGRAPHIC ENERGY DISPERSIVE X-RAY DIFFRACTION APPARATUS COMPRINSING AN ARRAY OF DETECTORS OF ASSOCIATED COLLIMATORS
|
|
|
Patent #:
|
|
Issue Dt:
|
10/07/2008
|
Application #:
|
10571183
|
Filing Dt:
|
03/09/2006
|
Publication #:
|
|
Pub Dt:
|
03/08/2007
| | | | |
Title:
|
IONISING PARTICLE ANALYSER ENABLING FOR EXAMPLE THE SEPARATION OF THE FLUORESCENT YIELD (FY) AND THE TOTAL ELECTRON YIELD (TEY) IN EXAPS (EXTENDED X-RAY ABSORPTION FINE STRUCTURE) MEASUREMENTS
|
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
11021699
|
Filing Dt:
|
12/22/2004
|
Publication #:
|
|
Pub Dt:
|
07/28/2005
| | | | |
Title:
|
Proportional gas counters
|
|