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Reel/Frame:059897/0793   Pages: 5
Recorded: 05/13/2022
Attorney Dkt #:TC22030052US-ICRD
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
17776637
Filing Dt:
05/13/2022
Publication #:
US20220399237
Pub Dt:
12/15/2022
Title:
CRITICAL DIMENSION ERROR ANALYSIS METHOD
Assignors
1
YU, XUERU
Exec Dt:
05/09/2022
2
SUN, HONGXIA
Exec Dt:
05/09/2022
3
LI, CHEN
Exec Dt:
05/09/2022
4
WANG, PENGFEI
Exec Dt:
05/09/2022
5
DUAN, JIEBIN
Exec Dt:
05/09/2022
6
WANG, XIUCUI
Exec Dt:
05/09/2022
7
FU, HAO
Exec Dt:
05/09/2022
8
ZHOU, TAO
Exec Dt:
05/09/2022
9
YAN, YAN
Exec Dt:
05/09/2022
10
XU, BOWEN
Exec Dt:
05/09/2022
11
GUO, LINGYI
Exec Dt:
05/09/2022
12
LI, LIREN
Exec Dt:
05/09/2022
Assignee
1
SHANGHAI IC R&D CENTER CO., LTD.
497 GAOSI ROAD, ZHANGJIANG HIGH-TECH PARK, PUDONG
SHANGHAI, CHINA 201210
Correspondence name and address
TIANCHEN LLC
3302 TOWER 1, NO.388 ZHONGJIANG ROAD, PUTUO
SHANGHAI, CHINA

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