Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 013469/0824 | |
| Pages: | 4 |
| | Recorded: | 11/05/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/27/2004
|
Application #:
|
10289005
|
Filing Dt:
|
11/05/2002
|
|
Publication #:
|
|
Pub Dt:
|
01/29/2004
| | | | |
|
Title:
|
METHOD AND SYSTEM FOR DETECTING PHASE DEFECTS IN LITHOGRAPHIC MASKS AND SEMICONDUCTOR WAFERS
|
|
|
Assignee
|
|
|
|
|
| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
|
|
Correspondence name and address
|
| |
BEYER WEAVER & THOMAS, LLP
|
| |
RUSSELL N. SWERDON
|
| |
P.O. BOX 778
|
| |
BERKELEY, CA 94704-0778
|
Search Results as of:
11/10/2024 12:52 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
