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Reel/Frame:055676/0828   Pages: 3
Recorded: 03/22/2021
Attorney Dkt #:18506-1408US2
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
09/20/2022
Application #:
17198764
Filing Dt:
03/11/2021
Publication #:
Pub Dt:
07/01/2021
Title:
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
Assignors
1
Exec Dt:
03/08/2021
2
Exec Dt:
03/10/2021
3
Exec Dt:
03/10/2021
4
Exec Dt:
03/08/2021
5
Exec Dt:
03/08/2021
Assignee
1
NO.8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK
HSINCHU, TAIWAN
Correspondence name and address
WPAT, PC INTELLECTUAL PROPERTY ATTORNEYS
1100 QUAIL STREET, SUITE 202
NEWPORT BEACH, 92660 UNITED STATES

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