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Patent Assignment Details
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Reel/Frame:015046/0837   Pages: 4
Recorded: 03/03/2004
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
10791629
Filing Dt:
03/03/2004
Publication #:
Pub Dt:
01/20/2005
Title:
System and method for testing semiconductor devices
Assignors
1
Exec Dt:
02/03/2004
2
Exec Dt:
02/03/2004
3
Exec Dt:
02/03/2004
4
Exec Dt:
02/04/2004
5
Exec Dt:
02/12/2004
6
Exec Dt:
02/12/2004
7
Exec Dt:
02/12/2004
8
Exec Dt:
02/12/2004
9
Exec Dt:
02/12/2004
Assignee
1
416 MAETAND 3-DONG, YEONGTONG-GU, SUWON-CITY
GYEONGGI-DO, KOREA, REPUBLIC OF
Correspondence name and address
HARNESS, DICKEY & PIERCE, P.L.C.
JOHN A. CASTELLANO
P.O. BOX 8910
RESTON, VA 20195

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