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Total properties:
96
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Patent #:
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Issue Dt:
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03/18/1986
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Application #:
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06525771
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Filing Dt:
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08/23/1983
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Title:
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OPTICAL FIBER THERMOMETER
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Patent #:
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Issue Dt:
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07/04/1989
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Application #:
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06694423
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Filing Dt:
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01/24/1985
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Title:
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METHOD AND APPARATUS FOR DETERMINING TEMPERATURE IN A BLACKBODY RADIATION SENSING SYSTEM
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Patent #:
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Issue Dt:
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12/15/1987
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Application #:
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06730669
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Filing Dt:
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05/02/1985
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Title:
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MULTI-CHANNEL FIBER OPTIC CONNECTOR
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Patent #:
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Issue Dt:
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06/07/1988
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Application #:
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06770679
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Filing Dt:
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08/29/1985
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Title:
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BLACKBODY RADIATION SENSING OPTICAL FIBER THERMOMETER SYSTEM
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Patent #:
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Issue Dt:
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12/06/1988
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Application #:
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07027828
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Filing Dt:
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03/19/1987
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Title:
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OPTICAL TEMPERATURE MEASUREMENT TECHNIQUES
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Patent #:
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Issue Dt:
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03/28/1989
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Application #:
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07113128
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Filing Dt:
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10/23/1987
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Title:
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METHOD AND APPARATUS FOR MEASURING STRONG MICROWAVE ELECTRIC FIELD STRENGTHS
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Patent #:
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Issue Dt:
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11/28/1989
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Application #:
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07164130
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Filing Dt:
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03/04/1988
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Title:
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FIBEROPTIC SENSING OF TERMPERATURE AND/OR OTHER PHYSICAL PARAMETERS
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Patent #:
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Issue Dt:
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01/30/1990
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Application #:
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07201599
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Filing Dt:
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06/02/1988
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Title:
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SENSORS FOR DETECTING ELECTROMAGNETIC PARAMETERS UTILIZING RESONATING ELEMENTS
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Patent #:
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Issue Dt:
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08/22/1989
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Application #:
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07228958
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Filing Dt:
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08/04/1988
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Title:
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OPTICAL SYSTEM USING A LUMINESCENT MATERIAL SENSOR FOR MEASURING VERY HIGH TEMPERATURES
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Patent #:
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10/01/1991
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Application #:
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07293228
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Filing Dt:
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01/03/1989
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Title:
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Patent #:
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01/22/1991
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Application #:
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07336836
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Filing Dt:
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04/12/1989
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Title:
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THREE-PARAMETER OPTICAL FIBER SENSOR AND SYSTEM
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Patent #:
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Issue Dt:
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04/30/1991
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Application #:
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07353963
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Filing Dt:
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05/19/1989
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Title:
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Patent #:
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Issue Dt:
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06/18/1991
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Application #:
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07354739
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Filing Dt:
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05/22/1989
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Title:
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Patent #:
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Issue Dt:
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01/29/1991
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Application #:
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07396996
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Filing Dt:
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08/22/1989
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Title:
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FIBEROPTIC SENSING OF TEMPERATURE AND/OR OTHER PHYSICAL PARAMETERS
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Patent #:
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06/01/1993
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07429983
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Filing Dt:
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11/01/1989
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Title:
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AUTOCALIBRATING DUAL SENSOR NON-CONTACT TEMPERATURE MEASURING DEVICE
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Patent #:
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Issue Dt:
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05/05/1992
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Application #:
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07472351
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Filing Dt:
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01/30/1990
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Title:
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FIBEROPTIC TECHNIQUES FOR MEASURING THE MAGNITUDE OF LOCAL MICROWAVE FIELDS AND POWER
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Patent #:
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Issue Dt:
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10/13/1992
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07507605
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Filing Dt:
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04/10/1990
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Title:
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NON-CONTACT TECHNIQUES FOR MEASURING TEMPERATURE OR RADIATION-HEATED OBJECTS
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Patent #:
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Issue Dt:
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11/12/1991
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07525467
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Filing Dt:
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05/18/1990
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Title:
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Patent #:
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05/04/1993
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07526558
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Filing Dt:
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05/18/1990
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Patent #:
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03/23/1993
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07526639
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05/18/1990
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Title:
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Patent #:
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03/02/1993
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07578056
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09/05/1990
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Title:
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METHOD OF ENDPOINT DETECTION AND STRUCTURE THEREFOR
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Patent #:
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08/11/1992
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07578538
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Filing Dt:
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09/05/1990
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Title:
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APPARATUS AND METHOD FOR MONITORING RADIANT ENERGY SIGNALS WITH VARIABLE SIGNAL GAIN AND RESOLUTION ENHANCEMENT
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Patent #:
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Issue Dt:
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04/21/1992
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Application #:
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07621900
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Filing Dt:
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12/04/1990
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Title:
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MODULAR LUMINESCENCE-BASED MEASURING SYSTEM USING FAST DIGITAL SIGNAL PROCESSING
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Patent #:
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Issue Dt:
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11/24/1992
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Application #:
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07653622
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Filing Dt:
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02/11/1991
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Title:
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THROUGH THE WAFER OPTICAL TRANSMISSION SENSOR
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Patent #:
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Issue Dt:
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03/31/1992
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07657326
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Filing Dt:
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02/19/1991
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Title:
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KNOCK DETECTOR USING OPTICAL FIBER THERMOMETER
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Patent #:
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Issue Dt:
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05/05/1992
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Application #:
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07678704
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Filing Dt:
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04/01/1991
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Title:
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METHOD OF MAKING A FIBEROPTIC SENSOR OF A MICROWAVE FIELD
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Patent #:
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Issue Dt:
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05/12/1992
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Application #:
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07683258
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Filing Dt:
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04/10/1991
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Title:
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TEMPERATURE MEASUREMENT WITH COMBINED PHOTO-LUMINESCENT AND BLACK BODY SENSING TECHNIQUES
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Patent #:
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11/24/1992
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Application #:
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07692578
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Filing Dt:
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04/29/1991
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Title:
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Patent #:
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09/27/1994
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07773039
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10/08/1991
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Title:
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MODULAR LUMINESCENCE-BASED MEASURING SYSTEM USING FAST DIGITAL SIGNAL PROCESSING
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02/02/1993
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07808012
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12/13/1991
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Title:
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TEMPERATURE MEASUREMENT WITH COMBINED PHOTO-LUMINESCENT AND BLACK BODY SENSING TECHNIQUES
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Patent #:
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03/15/1994
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07859819
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03/30/1992
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Title:
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AUTOCALIBRATING DUAL SENSOR NON-CONTACT TEMPERATURE MEASURING DEVICE
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Patent #:
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11/15/1994
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07874829
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04/28/1992
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Title:
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APPARATUS AND METHOD FOR MONITORING A TEMPERATURE USING A THERMALLY FUSED COMPOSITE BLACKBODY TEMPERATURE PROBE
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05/03/1994
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07896132
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06/09/1992
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Title:
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ENDPOINT AND UNIFORMITY DETERMINATIONS IN MATERIAL LAYER PROCESSING THROUGH MONITORING MULTIPLE SURFACE REGIONS ACROSS THE LAYER
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06/07/1994
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07943927
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09/11/1992
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NON-CONTACT TECHNIQUES FOR MEASURING TEMPERATURE OF RADIATION-HEATED OBJECTS
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04/19/1994
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07945229
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09/15/1992
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Title:
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03/08/1994
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07957660
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10/07/1992
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METHOD FOR CONTROL OF PHOTORESIST DEVELOP PROCESSES
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05/10/1994
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07999278
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12/28/1992
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Title:
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NON-CONTACT OPTICAL TECHNIQUES FOR MEASURING SURFACE CONDITIONS
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05/09/1995
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08019748
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02/19/1993
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11/08/1994
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08052401
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04/23/1993
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05/09/1995
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08075680
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06/11/1993
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MEASURING SYSTEM EMPLOYING A LUMINESCENT SENSOR AND METHODS OF DESIGNING THE SYSTEM
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11/28/1995
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08075743
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06/11/1993
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03/19/1996
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08122207
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09/16/1993
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OPTICAL TECHNIQUES OF MEASURING ENDPOINT DURING THE PROCESSING OF MATERIAL LAYERS IN AN OPTICALLY HOSTILE ENVIRONMENT
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02/13/1996
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08180641
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01/12/1994
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06/23/1998
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08180852
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01/12/1994
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NON-CONTACT OPTICAL TECHNIQUES FOR MEASURING SURFACE CONDITIONS
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11/07/1995
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08223631
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04/06/1994
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03/09/1999
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06/10/1994
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02/10/1998
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09/26/1994
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07/28/1998
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05/08/1995
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02/04/1997
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06/06/1995
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01/04/2000
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01/11/1996
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12/09/1997
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08615417
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03/14/1996
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OPTICAL TECHNIQUES OF MEASURING ENDPOINT DURING THE PROCESSING OF MATERIAL LAYERS IN AN OPTICALLY HOSTILE ENVIRONMENT
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04/06/1999
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06/11/1997
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OPTICAL TECHNIQUES OF MEASURING ENDPOINT DURING THE PROCESSING OF MATERIAL LAYERS IN AN OPTICALLY HOSTILE ENVIRONMENT
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06/18/2002
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06/17/1997
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02/22/2000
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07/23/1997
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08/29/2000
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08/27/1997
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OPTICAL TECHNIQUES OF MEASURING ENDPOINT DURING THE PROCESSING OF MATERIAL LAYERS IN AN OPTICALLY HOSTILE ENVIRONMENT
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04/27/1999
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09/26/1997
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07/30/2002
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06/15/1998
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OPTICAL TECHNIQUES OF MEASURING ENDPOINT DURING THE PROCESSING OF MATERIAL LAYERS IN AN OPTICALLY HOSTILE ENVIRONMENT
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08/31/1999
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06/16/1998
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04/24/2001
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04/07/1999
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06/20/2000
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04/14/1999
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OPTICAL TECHNIQUES OF MEASURING ENDPOINT DURING THE PROCESSING OF MATERIAL LAYERS IN AN OPTICALLY HOSTILE ENVIRONMENT
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05/27/2003
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05/24/1999
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OPTICAL TECHNIQUES FOR MEASURING LAYER THICKNESSES AND OTHER SURFACE CHARACTERISTICS OF OBJECTS SUCH AS SEMICONDUCTOR WAFERS
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07/02/2002
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02/14/2000
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11/25/2003
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05/24/2000
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OPTICAL TECHNIQUES FOR MEASURING LAYER THICKNESSES AND OTHER SURFACE CHARACTERISTICS OF OBJECTS SUCH AS SEMICONDUCTOR WAFERS
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06/03/2003
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04/20/2001
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IN SITU OPTICAL SURFACE TEMPERATURE MEASURING TECHNIQUES AND DEVICES
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08/23/2005
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09/26/2003
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OPTICAL TECHNIQUES FOR MEASURING LAYER THICKNESSES AND OTHER SURFACE CHARACTERISTICS OF OBJECTS SUCH AS SEMICONDUCTOR WAFERS
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07/25/2006
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05/05/2004
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12/23/2004
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IN SITU OPTICAL SURFACE TEMPERATURE MEASURING TECHNIQUES AND DEVICES
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07/25/2006
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05/05/2004
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12/23/2004
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05/09/2006
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Application #:
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11013070
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Filing Dt:
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12/15/2004
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Publication #:
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Pub Dt:
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05/19/2005
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Title:
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OPTICAL TECHNIQUES FOR MEASURING LAYER THICKNESSES AND OTHER SURFACE CHARACTERISTICS OF OBJECTS SUCH AS SEMICONDUCTOR WAFERS
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Patent #:
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Issue Dt:
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05/09/2006
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Application #:
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11013070
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Filing Dt:
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12/15/2004
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Publication #:
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Pub Dt:
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05/19/2005
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Title:
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OPTICAL TECHNIQUES FOR MEASURING LAYER THICKNESSES AND OTHER SURFACE CHARACTERISTICS OF OBJECTS SUCH AS SEMICONDUCTOR WAFERS
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11241579
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Filing Dt:
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09/30/2005
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Publication #:
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Pub Dt:
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04/05/2007
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Title:
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Devices, systems and methods for determining temperature and/or optical characteristics of a substrate
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11337641
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Filing Dt:
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01/23/2006
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Publication #:
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Pub Dt:
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07/26/2007
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Title:
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Electrical device measurement probes
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Patent #:
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Issue Dt:
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05/20/2008
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Application #:
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11361543
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Filing Dt:
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02/24/2006
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Publication #:
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Pub Dt:
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06/29/2006
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Title:
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IN SITU OPTICAL SURFACE TEMPERATURE MEASURING TECHNIQUES AND DEVICES
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11499530
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Filing Dt:
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08/04/2006
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Publication #:
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Pub Dt:
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02/07/2008
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Title:
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Systems and methods for monitoring temperature during electrosurgery or laser therapy
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Patent #:
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Issue Dt:
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Application #:
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UNAVAILABLE
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UNAVAILABLE
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UNAVAILABLE
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