Patent Assignment Details
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| Reel/Frame: | 026669/0850 | |
| Pages: | 14 |
| | Recorded: | 07/28/2011 | | |
| Attorney Dkt #: | 5222-16802/P1810US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/18/2017
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Application #:
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12997855
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Filing Dt:
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07/28/2011
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Publication #:
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Pub Dt:
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11/10/2011
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Title:
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SYSTEM AND METHOD FOR DETECTING DESIGN AND PROCESS DEFECTS ON A WAFER USING PROCESS MONITORING FEATURES
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Assignee
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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Correspondence name and address
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ENTROPY MATTERS LLC
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P.O. BOX 2250
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NEW YORK, NY 10021
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