Patent Assignment Details
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| Reel/Frame: | 044340/0861 | |
| Pages: | 3 |
| | Recorded: | 10/30/2017 | | |
| Attorney Dkt #: | LAR-18306-1 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/05/2017
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Application #:
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14484517
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Filing Dt:
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09/12/2014
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Publication #:
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Pub Dt:
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03/19/2015
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Title:
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X-ray Diffraction (XRD) Characterization Methods for Sigma=3 Twin Defects in Cubic Semiconductor (100) Wafers
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Assignee
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| 300 E. STREET SW |
| WASHINGTON, DISTRICT OF COLUMBIA 20546 |
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Correspondence name and address
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NASA LANGLEY RESEARCH CENTER
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OFFICE OF CHIEF COUNSEL
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MAIL STOP 30
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HAMPTON, VA 23681-2199
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