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Reel/Frame:041002/0879   Pages: 9
Recorded: 01/15/2017
Attorney Dkt #:KLA P3878US2
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
08/13/2019
Application #:
15406732
Filing Dt:
01/15/2017
Publication #:
Pub Dt:
09/05/2019
Title:
SYSTEMS, METHODS AND METRICS FOR WAFER HIGH ORDER SHAPE CHARACTERIZATION AND WAFER CLASSIFICATION USING WAFER DIMENSIONAL GEOMETRY TOOL
Assignors
1
Exec Dt:
09/10/2012
2
Exec Dt:
09/10/2012
3
Exec Dt:
09/10/2012
4
Exec Dt:
09/10/2012
5
Exec Dt:
09/10/2012
Assignee
1
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY
SUITE 220
OMAHA, NE 68154-5299

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