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Reel/Frame:047988/0884   Pages: 8
Recorded: 01/14/2019
Attorney Dkt #:KLA-119 (P5104)
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
05/17/2022
Application #:
16030849
Filing Dt:
07/09/2018
Publication #:
Pub Dt:
01/17/2019
Title:
Methods And Systems For Semiconductor Metrology Based On Polychromatic Soft X-Ray Diffraction
Assignors
1
Exec Dt:
07/17/2018
2
Exec Dt:
07/11/2018
3
Exec Dt:
01/10/2019
4
Exec Dt:
07/10/2018
5
Exec Dt:
08/27/2018
6
Exec Dt:
11/02/2018
Assignee
1
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
JOSEPH S SPANO
851 BURLWAY ROAD, SUITE 407
BURLINGAME, CA 94010

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