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Total properties:
23
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Patent #:
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Issue Dt:
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08/21/1984
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Application #:
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06326224
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Filing Dt:
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12/01/1981
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Title:
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EBULLIOMETRIC HOT SPOT DETECTOR
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Patent #:
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Issue Dt:
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11/27/1984
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Application #:
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06326274
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Filing Dt:
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12/01/1981
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Title:
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METHOD AND APPARATUS FOR DETERMINING BOILING POINTS OF LIQUIDS
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Patent #:
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Issue Dt:
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10/09/1984
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Application #:
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06381174
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Filing Dt:
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05/24/1982
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Title:
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BONDER APPARATUS
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Patent #:
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Issue Dt:
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09/11/1984
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Application #:
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06381470
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Filing Dt:
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05/24/1982
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Title:
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METHOD AND DEVICE FOR INDICATING POINT OF CONTACT
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Patent #:
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Issue Dt:
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02/19/1985
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Application #:
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06383515
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Filing Dt:
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06/01/1982
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Title:
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APPARATUS FOR MANUFACTURING A HOT SPOT THERMOCOUPLE METHOD AND
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Patent #:
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Issue Dt:
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07/22/1986
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Application #:
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06573054
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Filing Dt:
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01/23/1984
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Title:
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MANIPULATION OF EMBRYOS AND OVA
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Patent #:
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Issue Dt:
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08/19/1986
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Application #:
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06607693
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Filing Dt:
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05/07/1984
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Title:
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METHOD AND APPARATUS FOR LOW TEMPERATURE TESTING OF ELECTRONIC COMPONENTS
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Patent #:
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Issue Dt:
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01/16/1990
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Application #:
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07256672
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Filing Dt:
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10/12/1988
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Title:
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TEST STATION
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Patent #:
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Issue Dt:
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09/18/1990
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Application #:
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07433021
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Filing Dt:
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11/06/1989
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Title:
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PROBE ASSEMBLY INCLUDING TOUCHDOWN SENSOR
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Patent #:
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Issue Dt:
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04/06/1999
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Application #:
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08555186
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Filing Dt:
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11/08/1995
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Title:
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PORTABLE EMISSION MICROSCOPE WORKSTATION FOR FAILURE ANALYSIS
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Patent #:
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Issue Dt:
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06/09/1998
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Application #:
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08638638
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Filing Dt:
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04/26/1996
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Title:
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ELIMINATION OF VIBRATION BY VIBRATION COUPLING IN MICROSCOPY APPLICATIONS
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Patent #:
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Issue Dt:
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10/19/1999
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Application #:
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08744372
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Filing Dt:
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11/07/1996
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Title:
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INTEGRATED CIRCUIT FAILURE ANALYSIS USING COLOR VOLTAGE CONTRAST
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Patent #:
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Issue Dt:
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03/06/2001
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Application #:
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09140910
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Filing Dt:
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08/27/1998
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Title:
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HIGH RESOLUTION ANALYTICAL PROBE STATION
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Patent #:
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Issue Dt:
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02/20/2001
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Application #:
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09527874
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Filing Dt:
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03/17/2000
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Title:
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High resolution analytical probe station
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Patent #:
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Issue Dt:
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07/23/2002
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Application #:
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09615454
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Filing Dt:
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07/13/2000
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Title:
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WAFER PROBE STATION
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|
|
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Patent #:
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Issue Dt:
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09/16/2003
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Application #:
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09774249
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Filing Dt:
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01/30/2001
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Publication #:
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Pub Dt:
|
01/03/2002
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Title:
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HIGH RESOLUTION ANALYTICAL PROBE STATION
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|
|
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Patent #:
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Issue Dt:
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03/02/2004
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Application #:
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09815952
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Filing Dt:
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03/23/2001
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Publication #:
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Pub Dt:
|
06/20/2002
| | | | |
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Title:
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TRIAXIAL PROBE ASSEMBLY
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|
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Patent #:
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Issue Dt:
|
06/01/2004
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Application #:
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10119346
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Filing Dt:
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04/08/2002
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Publication #:
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Pub Dt:
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03/06/2003
| | | | |
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Title:
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HIGH RESOLUTION ANALYTICAL PROBE STATION
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|
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Patent #:
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Issue Dt:
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10/12/2004
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Application #:
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10134908
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Filing Dt:
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04/29/2002
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Publication #:
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Pub Dt:
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08/29/2002
| | | | |
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Title:
|
WAFER PROBE STATION
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|
|
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Patent #:
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Issue Dt:
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01/04/2005
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Application #:
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10662830
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Filing Dt:
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09/15/2003
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Publication #:
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Pub Dt:
|
03/25/2004
| | | | |
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Title:
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HIGH RESOLUTION ANALYTICAL PROBE STATION
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|
|
|
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Patent #:
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|
Issue Dt:
|
07/12/2005
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Application #:
|
10794777
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Filing Dt:
|
03/05/2004
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|
Publication #:
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Pub Dt:
|
11/18/2004
| | | | |
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Title:
|
WAFER PROBE STATION
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|
|
|
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Patent #:
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|
Issue Dt:
|
02/20/2007
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Application #:
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10816114
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Filing Dt:
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04/01/2004
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Publication #:
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Pub Dt:
|
10/21/2004
| | | | |
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Title:
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HIGH RESOLUTION ANALYTICAL PROBE STATION
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|
|
|
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Patent #:
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Issue Dt:
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05/16/2006
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Application #:
|
10997432
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Filing Dt:
|
11/24/2004
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|
Publication #:
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|
Pub Dt:
|
09/08/2005
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Title:
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METHOD AND APPARATUS FOR MAINTAINING ACCURATE POSITIONING BETWEEN A PROBE AND A DUT
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