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Reel/Frame:064092/0914   Pages: 4
Recorded: 06/28/2023
Attorney Dkt #:2677NS-000851-US
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
18333209
Filing Dt:
06/12/2023
Publication #:
Pub Dt:
12/28/2023
Title:
SEMICONDUCTOR WAFER TEST SYSTEM FOR CONTROLLING SUPPLY OF POWER TO SEMICONDUCTOR WAFER TEST APPARATUS AND METHOD OF CONTROLLING SUPPLY OF POWER TO SEMICONDUCTOR WAFER TEST APPARATUS
Assignors
1
Exec Dt:
06/01/2023
2
Exec Dt:
06/01/2023
3
Exec Dt:
06/01/2023
4
Exec Dt:
06/01/2023
Assignee
1
29 PANGYO-RO 255BEON-GIL, BUNDANG-GU
SEONGNAM-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 13486
Correspondence name and address
HARNESS, DICKEY & PIERCE, P.L.C.
P.O. BOX 8910
RESTON, VA 20195

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