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Patent Assignment Details

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Reel/Frame:	028222/0934			Pages:	6
		Recorded:	04/18/2012
Attorney Dkt #:	22524-01000
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 13

Patent #:	7698665	Issue Dt:	04/13/2010	Application #:	11245691	Filing Dt:	10/06/2005
Publication #:	US20070009808	Pub Dt:	01/11/2007
Title:	SYSTEMS, MASKS, AND METHODS FOR MANUFACTURABLE MASKS USING A FUNCTIONAL REPRESENTATION OF POLYGON PATTERN

Patent #:	7788627	Issue Dt:	08/31/2010	Application #:	11538290	Filing Dt:	10/03/2006
Publication #:	US20070184369	Pub Dt:	08/09/2007
Title:	LITHOGRAPHY VERIFICATION USING GUARD BANDS

Patent #:	7921385	Issue Dt:	04/05/2011	Application #:	11538420	Filing Dt:	10/03/2006
Publication #:	US20070186208	Pub Dt:	08/09/2007
Title:	MASK-PATTERN DETERMINATION USING TOPOLOGY TYPES

Patent #:	7793253	Issue Dt:	09/07/2010	Application #:	11538782	Filing Dt:	10/04/2006
Publication #:	US20070196742	Pub Dt:	08/23/2007
Title:	MASK-PATTERNS INCLUDING INTENTIONAL BREAKS

Patent #:	7703049	Issue Dt:	04/20/2010	Application #:	11539601	Filing Dt:	10/06/2006
Publication #:	US20070186206	Pub Dt:	08/09/2007
Title:	SYSTEM, MASKS, AND METHODS FOR PHOTOMASKS OPTIMIZED WITH APPROXIMATE AND ACCURATE MERIT FUNCTIONS

Patent #:	8082524	Issue Dt:	12/20/2011	Application #:	12423686	Filing Dt:	04/14/2009
Publication #:	US20090319978	Pub Dt:	12/24/2009
Title:	MASK PATTERNS FOR USE IN MULTIPLE-EXPOSURE LITHOGRAPHY

Patent #:	8082525	Issue Dt:	12/20/2011	Application #:	12423693	Filing Dt:	04/14/2009
Publication #:	US20090293037	Pub Dt:	11/26/2009
Title:	TECHNIQUE FOR CORRECTING HOTSPOTS IN MASK PATTERNS AND WRITE PATTERNS

Patent #:	8683396	Issue Dt:	03/25/2014	Application #:	12507336	Filing Dt:	07/22/2009
Publication #:	US20110022994	Pub Dt:	01/27/2011
Title:	DETERMINING SOURCE PATTERNS FOR USE IN PHOTOLITHOGRAPHY

Patent #:	8498469	Issue Dt:	07/30/2013	Application #:	12715351	Filing Dt:	03/01/2010
Publication #:	US20110211748	Pub Dt:	09/01/2011
Title:	Full-Field Mask Error Enhancement Function

Patent #:	8285030	Issue Dt:	10/09/2012	Application #:	12724362	Filing Dt:	03/15/2010
Publication #:	US20110222739	Pub Dt:	09/15/2011
Title:	DETERMINING CALIBRATION PARAMETERS FOR A LITHOGRAPHIC PROCESS

Patent #:	NONE	Issue Dt:		Application #:	13297016	Filing Dt:	11/15/2011
Publication #:	US20130125070	Pub Dt:	05/16/2013
Title:	OPC Checking and Classification

Patent #:	8473878	Issue Dt:	06/25/2013	Application #:	13305650	Filing Dt:	11/28/2011
Publication #:	US20130139116	Pub Dt:	05/30/2013
Title:	LITHOGRAPHICALLY ENHANCED EDGE DETERMINATION

Patent #:	8510683	Issue Dt:	08/13/2013	Application #:	13313957	Filing Dt:	12/07/2011
Publication #:	US20130152026	Pub Dt:	06/13/2013
Title:	SPATIAL MAP OF MASK-PATTERN DEFECTS

Assignor

Exec Dt:

04/17/2012

Assignee

700 EAST MIDDLEFIELD ROA

MOUNTIAN VIEW, CALIFORNIA 94043

Correspondence name and address
	ROBIN W. REASONER
	801 CALIFORNIA STREET
	MOUNTAIN VIEW, CALIFORNIA 94041

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