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Reel/Frame:035866/0943   Pages: 3
Recorded: 06/19/2015
Attorney Dkt #:FIS920150057US1
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
02/13/2018
Application #:
14744198
Filing Dt:
06/19/2015
Publication #:
Pub Dt:
12/22/2016
Title:
NON-DESTRUCTIVE DIELECTRIC LAYER THICKNESS AND DOPANT MEASURING METHOD
Assignors
1
Exec Dt:
06/17/2015
2
Exec Dt:
06/17/2015
Assignee
1
NEW ORCHARD ROAD
ARMONK, NEW YORK 10504
Correspondence name and address
HOFFMAN WARNICK LLC
540 BROADWAY
4TH FLOOR
ALBANY, NY 12207

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