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Reel/Frame:012263/0944   Pages: 29
Recorded: 11/21/2001
Conveyance: TERMINATION OF SECURITY INTEREST
Total properties: 215
Page 3 of 3
Pages: 1 2 3
1
Patent #:
Issue Dt:
11/18/2003
Application #:
09834118
Filing Dt:
04/12/2001
Publication #:
Pub Dt:
10/17/2002
Title:
METHOD OF CALIBRATING A SEMICONDUCTOR WAFER DRYING APPARATUS
2
Patent #:
NONE
Issue Dt:
Application #:
09834819
Filing Dt:
04/13/2001
Publication #:
Pub Dt:
10/17/2002
Title:
System and method for reconditioning a chiller
3
Patent #:
Issue Dt:
12/31/2002
Application #:
09853232
Filing Dt:
05/11/2001
Publication #:
Pub Dt:
10/11/2001
Title:
PROCESS FOR GROWING SILICON CRYSTALS WHICH ALLOWS FOR VARIABILITY IN PROCESS CONDITIONS WHILE SUPPRESSING THE FORMATION OF AGGLOMERATED INTRINSIC POINT DEFECTS
4
Patent #:
Issue Dt:
03/25/2003
Application #:
09859094
Filing Dt:
05/16/2001
Publication #:
Pub Dt:
10/25/2001
Title:
EPITAXIAL SILICON WAFER WITH INTRINSIC GETTERING AND A METHOD FOR THE PREPARATION THEREOF
5
Patent #:
Issue Dt:
10/08/2002
Application #:
09859826
Filing Dt:
05/17/2001
Publication #:
Pub Dt:
10/25/2001
Title:
BARIUM DOPING OF MOLTEN SILICON FOR USE IN CRYSTAL GROWING PROCESS
6
Patent #:
NONE
Issue Dt:
Application #:
09865083
Filing Dt:
05/24/2001
Publication #:
Pub Dt:
12/12/2002
Title:
METHOD FOR CALIBRATING NANOTOPOGRAPHIC MEASURING EQUIPMENT
7
Patent #:
Issue Dt:
04/30/2002
Application #:
09869084
Filing Dt:
06/20/2001
Title:
METHOD FOR STORING CARRIER FOR POLISHING WAFER
8
Patent #:
Issue Dt:
02/10/2004
Application #:
09871255
Filing Dt:
05/31/2001
Publication #:
Pub Dt:
05/09/2002
Title:
PROCESS FOR PREPARING LOW DEFECT DENSITY SILICON USING HIGH GROWTH RATES
9
Patent #:
Issue Dt:
05/20/2003
Application #:
09874487
Filing Dt:
06/05/2001
Publication #:
Pub Dt:
11/15/2001
Title:
AN EPITAXIAL WAFER SUBSTANTIALLY FREE OF GROWN-IN DEFECTS
10
Patent #:
Issue Dt:
12/16/2003
Application #:
09892002
Filing Dt:
06/26/2001
Publication #:
Pub Dt:
12/26/2002
Title:
CRYSTAL PULLER AND METHOD FOR GROWING MONOCRYSTALLINE SILICON INGOTS
11
Patent #:
NONE
Issue Dt:
Application #:
09896945
Filing Dt:
06/29/2001
Publication #:
Pub Dt:
03/21/2002
Title:
Process for etching silicon wafers
12
Patent #:
Issue Dt:
03/23/2004
Application #:
09928559
Filing Dt:
08/13/2001
Publication #:
Pub Dt:
05/02/2002
Title:
METHOD AND APPARATUS FOR PROCESSING A SEMICONDUCTOR WAFER USING NOVEL FINAL POLISHING METHOD
13
Patent #:
Issue Dt:
08/13/2002
Application #:
09929585
Filing Dt:
08/14/2001
Publication #:
Pub Dt:
01/03/2002
Title:
PROCESS FOR THE PREPARATION OF NON-OXYGEN PRECIPITATING CZOCHRALSKI SILICON WAFERS
14
Patent #:
NONE
Issue Dt:
Application #:
09970404
Filing Dt:
10/03/2001
Publication #:
Pub Dt:
04/03/2003
Title:
Apparatus and process for producing polished semiconductor wafers
15
Patent #:
Issue Dt:
02/22/2005
Application #:
09972608
Filing Dt:
10/05/2001
Publication #:
Pub Dt:
05/16/2002
Title:
METHOD FOR THE PRODUCTION OF LOW DEFECT DENSITY SILICON
Assignor
1
Exec Dt:
11/13/2001
Assignee
1
501 PEARL DRIVE
ST. PETERS, MISSOURI 63376
Correspondence name and address
CLEARY, COTTLIEB, STEEN & HAMILTON
PAUL SHIM
ONE LIBERTY PLAZA
NEW YORK, NY 10006

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