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Reel/Frame:023574/0970   Pages: 25
Recorded: 12/01/2009
Attorney Dkt #:8/1034-1 (V14021)
Conveyance: CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Total properties: 3
1
Patent #:
Issue Dt:
06/29/1993
Application #:
07575486
Filing Dt:
08/29/1990
Title:
INTERRUPTED DEVELOPING PROCESS FOR A PHOTORESIST IMAGE
2
Patent #:
Issue Dt:
11/24/1992
Application #:
07635103
Filing Dt:
01/07/1991
Title:
A RADIATION-SENSITIVE SENSOR HAVING A PLURALITY OF RADIATION SENSITIVE ELEMENTS ARRANGED SUBSTANTIALLY CIRCULAR WITH RADIALLY DECREASING DENSITY
3
Patent #:
Issue Dt:
12/17/1996
Application #:
08345300
Filing Dt:
11/28/1994
Title:
METHOD FOR DETERMINING THE RESISTANCE AND CARRIER PROFILE OF A SEMI- CONDUCTOR ELEMENT USING A SCANNING PROXIMITY MICROSCOPE
Assignor
1
Exec Dt:
01/16/1984
Assignee
1
KAPELDREEF 75
3001 LEUVEN, BELGIUM
Correspondence name and address
OSTROLENK FABER LLP
1180 AVENUE OF THE AMERICAS
NEW YORK, NY 100368403

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