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Patent Assignment Details
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Reel/Frame:020356/0974   Pages: 4
Recorded: 01/11/2008
Attorney Dkt #:US14212
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
12013372
Filing Dt:
01/11/2008
Publication #:
Pub Dt:
01/29/2009
Title:
APPARATUS FOR TESTING CHIPS WITH BALL GRID ARRAY
Assignors
1
Exec Dt:
01/02/2008
2
Exec Dt:
01/02/2008
3
Exec Dt:
01/02/2008
Assignees
1
XINYUAN INDUSTRIAL ZONE, TANGWEI VILLAGE,FUYONG TOWN, BAO' AN DISTRICT
SHENZHEN CITY, GUANGDONG PROVINCE, CHINA
2
NO. 6, LANE 28, SAN HO RD., SAN SHI VILLAGE
TAYUAN, TAOYUAN, TAIWAN
Correspondence name and address
JEFFREY KNAPP
458 E. LAMBERT ROAD
FULLERTON, CA 92835

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