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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
08/07/2018
Application #:
15449284
Filing Dt:
03/03/2017
Publication #:
Pub Dt:
06/21/2018
Inventors:
Tien-Wei Chiang, Harry-Hak-Lay Chuang, Wen-Chun You
Title:
DETERMINING A CHARACTERISTIC OF A MONITORED LAYER ON AN INTEGRATED CHIP
Assignment: 1
Reel/Frame:
041462/0444Recorded: 03/03/2017Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/22/2017
Exec Dt:
02/22/2017
Exec Dt:
02/22/2017
Assignee:
NO. 8, LI-HSIN RD. 6
HSIN-CHU SCIENCE PARK
HSIN-CHU, TAIWAN 300-77
Correspondent:
ESCHWEILER & ASSOCIATES, LLC.
629 EUCLID AVENUE, SUITE 1000
NATIONAL CITY BANK BUILDING
CLEVELAND, OH 44114

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