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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
10082471
Issue Dt:
09/25/2018
Application #:
15396805
Filing Dt:
01/02/2017
Publication #:
20180188185
Pub Dt:
07/05/2018
Inventors:
Yung-Teng Tsai, Hung-Chin Lin, Chia-Chen Sun, Chih-Yu Wu, Jun-Ming Chen, Chung-Chih Hung et al
Title:
SEMICONDUCTOR STRUCTURE AND METHOD FOR REVIEWING DEFECTS
Assignment: 1
Reel/Frame:
040817/0544Recorded: 01/02/2017Pages: 16
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
TSAI, YUNG-TENG
Exec Dt:
12/29/2016
LIN, HUNG-CHIN
Exec Dt:
12/29/2016
SUN, CHIA-CHEN
Exec Dt:
12/29/2016
WU, CHIH-YU
Exec Dt:
12/29/2016
CHEN, JUN-MING
Exec Dt:
12/29/2016
HUNG, CHUNG-CHIH
Exec Dt:
12/29/2016
CHEN, SHENG-CHIEH
Exec Dt:
12/29/2016
Assignee:
UNITED MICROELECTRONICS CORP.
NO.3, LI-HSIN ROAD 2, SCIENCE-BASED INDUSTRIAL PARK
HSIN-CHU CITY, TAIWAN
Correspondent:
WINSTON HSU
P.O.BOX 506
MERRIFIELD, VA 22116
Assignment: 2
Reel/Frame:
056991/0292Recorded: 07/26/2021Pages: 37
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
UNITED MICROELECTRONICS CORPORATION
Exec Dt:
06/18/2021
Assignee:
MARLIN SEMICONDUCTOR LIMITED
BRACKEN ROAD, SANDYFORD
FIRST FLOOR, BLACKTHORN EXCHANGE
DUBLIN, IRELAND D18 P3Y9
Correspondent:
LONGITUDE LICENSING LTD
BRACKEN ROAD, SANDYFORD
FIRST FLOOR, BLACKTHORN EXCHANGE
DUBLIN, D18 P3Y9 IRELAND

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