Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/29/2019
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Application #:
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15776027
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Filing Dt:
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05/14/2018
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Publication #:
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Pub Dt:
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11/22/2018
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Inventors:
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Shin Kamei, Makoto Jizodo, Kotaro Takeda, Hiroshi Fukuda
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Title:
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SILICON OPTICAL CIRCUIT FOR FLAW DETECTION IN AN OPTICAL CIRCUIT ELEMENT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 5-1, OTEMACHI 1-CHOME |
| CHIYODA-KU |
| TOKYO, JAPAN 1008116 |
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| WORKMAN NYDEGGER |
| 60 EAST SOUTH TEMPLE |
| SUITE 1000 |
| SALT LAKE CITY, UT 84111 |
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