Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/05/2019
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Application #:
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15409922
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Filing Dt:
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01/19/2017
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Publication #:
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Pub Dt:
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09/07/2017
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Inventors:
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Sangkyo Lim, MiJung Jeon, Woongkyu Son, Sunhee Shim
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Title:
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INSPECTION METHOD AND SYSTEM AND A METHOD OF INSPECTING A SEMICONDUCTOR DEVICE USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 129, SAMSUNG-RO,YEONGTONG-GU, GYEONGGI-DO |
| SUWON-SI, KOREA, REPUBLIC OF |
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| ANTHONY P. ONELLO, JR. |
| THREE BURLINGTON WOODS DRIVE |
| SUITE 203 |
| BURLINGTON, MA 01803 |
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