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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/05/2019
Application #:
15857691
Filing Dt:
12/29/2017
Inventors:
Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli et al
Title:
Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of a Resistance Through a Stitch, Where Such Measurements Are Obtained by Scanning a Pad Comprised of at Least Three Parallel Conductive Stripes Using a Moving Stage with Beam Deflection to Account for Motion of the Stage
Assignment: 1
Reel/Frame:
044509/0403Recorded: 12/30/2017Pages: 18
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/21/2016
Exec Dt:
04/15/2016
Exec Dt:
04/20/2016
Exec Dt:
05/06/2016
Exec Dt:
04/13/2016
Exec Dt:
04/12/2016
Exec Dt:
04/28/2016
Exec Dt:
04/26/2016
Exec Dt:
04/13/2016
Exec Dt:
04/13/2016
Exec Dt:
04/12/2016
Exec Dt:
04/18/2016
Exec Dt:
04/14/2016
Exec Dt:
04/15/2016
Exec Dt:
04/28/2016
Exec Dt:
04/25/2016
Exec Dt:
04/18/2016
Exec Dt:
04/21/2016
Exec Dt:
04/26/2016
Exec Dt:
04/13/2016
Exec Dt:
04/28/2016
Exec Dt:
04/13/2016
Exec Dt:
04/13/2016
Exec Dt:
04/12/2016
Exec Dt:
04/21/2016
Exec Dt:
04/13/2016
Assignee:
333 W. SAN CARLOS ST.
STE 1000
SAN JOSE, CALIFORNIA 95110
Correspondent:
DAVID GARROD, PH.D., ESQ.
711 IVY STREET
PITTSBURGH, PA 15232

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