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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/19/2019
Application #:
15219290
Filing Dt:
07/26/2016
Publication #:
Pub Dt:
11/30/2017
Inventors:
Jin-Fu Li, Han-Yu Wu, Che-Wei Chou, Yong-Xiao Chen
Title:
DELAY MEASUREMENT CIRCUIT AND MEASURING METHOD THEREOF
Assignment: 1
Reel/Frame:
039264/0540Recorded: 07/26/2016Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/22/2016
Exec Dt:
07/22/2016
Exec Dt:
07/22/2016
Exec Dt:
07/22/2016
Assignee:
NO.300, JUNGDA RD., JUNGLI DIST,
TAOYUAN, TAIWAN 320
Correspondent:
JIANQ CHYUN INTELLECTUAL PROPERTY OFFICE
7F.-1, NO. 100, ROOSEVELT RD., SEC. 2,
TAIPEI, TAIWAN

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