Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/16/2019
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Application #:
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15529281
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Filing Dt:
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05/24/2017
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Publication #:
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Pub Dt:
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09/14/2017
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Inventors:
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Hideo MORISHITA, Hiroya OHTA, Daisuke BIZEN, Michio HATANO
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Title:
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SCANNING ELECTRON MICROSCOPE AND ELECTRON TRAJECTORY ADJUSTMENT METHOD THEREFOR
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6-6, MARUNOUCHI 1-CHOME |
| CHIYODA-KU, TOKYO, JAPAN 100-8280 |
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| ERIC G. KING |
| MILES & STOCKBRIDGE PC |
| 1751 PINNACLE DRIVE, SUITE 1500 |
| TYSONS CORNER, VA 22102-3833 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 17-1, TORANOMON 1-CHOME, MINATO-KU |
| TOKYO, JAPAN 1056409 |
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| MATTINGLY & MALUR, PC |
| 1800 DIAGONAL ROAD |
| SUITE 210 |
| ALEXANDRIA, VA 22314 |
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