Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/07/2019
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Application #:
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15867070
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Filing Dt:
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01/10/2018
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Publication #:
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Pub Dt:
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12/13/2018
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Inventors:
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Min Ho Rim, YU SIN YANG, CHUNG SAM JUN, YUN JUNG JEE
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Title:
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SYSTEMS AND METHODS OF TESTING SEMICONDUCTOR DEVICES USING SIMULTANEOUSLY SCANNING OF A PLURALITY OF REGIONS THEREIN AND METHODS OF FORMING SEMICONDUCTOR DEVICES USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 129, SAMSUNG-RO, YEONGTONG-GU |
| SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 443-742 |
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| WARD AND SMITH, P.A. |
| 5430 WADE PARK BOULEVARD |
| RALEIGH, NC 27607 |
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