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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
06/11/2019
Application #:
15432684
Filing Dt:
02/14/2017
Publication #:
Pub Dt:
06/08/2017
Inventors:
Wouter Lodewijk ELINGS, Franciscus Bernardus Maria VAN BILSEN et al
Title:
Methods and Apparatus for Measuring a Property of a Substrate
Assignment: 1
Reel/Frame:
043468/0156Recorded: 08/31/2017Pages: 13
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/03/2012
Exec Dt:
01/05/2012
Exec Dt:
01/02/2012
Exec Dt:
01/02/2012
Exec Dt:
01/09/2012
Exec Dt:
01/16/2012
Exec Dt:
01/31/2012
Exec Dt:
01/18/2012
Exec Dt:
01/03/2012
Exec Dt:
01/31/2012
Exec Dt:
01/03/2012
Assignee:
DE RUN 6501
VELDHOVEN, NETHERLANDS NL - 5504 DR
Correspondent:
STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
1100 NEW YORK AVENUE, N.W.
WASHINGTON, DC 20005

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