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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/03/2019
Application #:
15460488
Filing Dt:
03/16/2017
Publication #:
Pub Dt:
09/21/2017
Inventors:
Sung Ho KANG, Young Woo LEE
Title:
CIRCUIT FOR TESTING AND ANALYZING TSV AND METHOD OF TESTING THE SAME
Assignment: 1
Reel/Frame:
041600/0021Recorded: 03/16/2017Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/10/2017
Exec Dt:
03/10/2017
Assignee:
50, YONSEI-RO, SEODAEMUN-GU
SEOUL, KOREA, REPUBLIC OF 03722
Correspondent:
SUGHRUE MION, PLLC
2100 PENNSYLVANIA AVENUE NW
WASHINGTON, DC 20037

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