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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
11/05/2019
Application #:
14981953
Filing Dt:
12/29/2015
Publication #:
Pub Dt:
06/30/2016
Inventors:
Kejun KANG, Shuwei LI, Qingjun ZHANG, Yuanjing LI, Yaohong LIU, Yulan LI, Ziran ZHAO et al
Title:
X-RAY BEAM INTENSITY MONITORING DEVICE AND X-RAY INSPECTION SYSTEM
Assignment: 1
Reel/Frame:
041628/0280Recorded: 03/20/2017Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/16/2017
Exec Dt:
03/16/2017
Exec Dt:
03/16/2017
Exec Dt:
03/16/2017
Exec Dt:
03/16/2017
Exec Dt:
03/16/2017
Exec Dt:
03/16/2017
Exec Dt:
03/16/2017
Exec Dt:
03/16/2017
Exec Dt:
03/16/2017
Exec Dt:
03/16/2017
Assignees:
QING HUA YUAN, HAIDIAN DISTRICT
BEIJING, CHINA 100084
2ND FLOOR, BLOCK A, TONGFANG BUILDING,
SHUANGQING ROAD, HAIDIAN DISTRICT
BEIJING, CHINA 100084
Correspondent:
KILPATRICK TOWNSEND & STOCKTON LLP MAILS
1100 PEACHTREE STREET
SUITE 2800
ATLANTA, GA 30309

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