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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
11/12/2019
Application #:
15789653
Filing Dt:
10/20/2017
Publication #:
Pub Dt:
06/07/2018
Inventors:
Sang-Uhn Cha, Ye-Sin Ryu, Young-Sik Kim, Su-Yeon Doo
Title:
ERROR DETECTION CODE GENERATION CIRCUITS OF SEMICONDUCTOR DEVICES, MEMORY CONTROLLERS INCLUDING THE SAME AND SEMICONDUCTOR MEMORY DEVICES INCLUDING THE SAME
Assignment: 1
Reel/Frame:
043916/0507Recorded: 10/20/2017Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/23/2017
Exec Dt:
05/24/2017
Exec Dt:
05/22/2017
Exec Dt:
05/22/2017
Assignee:
129, SAMSUNG-RO, YEONGTONG-GU,
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 16677
Correspondent:
F. CHAU & ASSOCIATES, LLC
130 WOODBURY ROAD
WOODBURY, NY 11797

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