Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/19/2019
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Application #:
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15524925
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Filing Dt:
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05/05/2017
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Publication #:
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Pub Dt:
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11/09/2017
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Inventors:
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Yuichi OZAWA, Yasuhito IGUCHI, Tetsuo YOSHIDA, Junzo KOSHIO
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Title:
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WAFER INSPECTION METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2968-2, ISHIKAWA-MACHI |
| HACHIOJI-SHI, TOKYO, JAPAN |
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| PAUL A. FATTIBENE |
| 2480 POST ROAD |
| SOUTHPORT, CT 06890 |
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