Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/21/2020
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Application #:
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15802587
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Filing Dt:
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11/03/2017
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Publication #:
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Pub Dt:
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02/22/2018
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Inventors:
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Jeanne P. Bickford, Nazmul Habib, Baozhen Li, Tad J. Wilder
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Title:
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INTEGRATED CIRCUIT CHIP RELIABILITY QUALIFICATION USING A SAMPLE-SPECIFIC EXPECTED FAIL RATE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NEW ORCHARD ROAD |
| ARMONK, NEW YORK 10504 |
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| FREDERICK W. GIBB, III GIBB & RILEY, LLC |
| 844 WEST STREET |
| SUITE 200 |
| ANNAPOLIS, MD 21401 |
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