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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
10636621
Issue Dt:
04/28/2020
Application #:
15560286
Filing Dt:
09/21/2017
Publication #:
20180076004
Pub Dt:
03/15/2018
Inventors:
Akinari HANAWA, Hideki KIKUCHI, Yoshifumi TANIGUCHI, Toshie YAGUCHI, Takashi DOBASHI et al
Title:
Charged Particle Beam Device for Moving an Aperture Having Plurality of Openings and Sample Observation Method
Assignment: 1
Reel/Frame:
043655/0176Recorded: 09/21/2017Pages: 9
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
HANAWA, AKINARI
Exec Dt:
09/07/2017
KIKUCHI, HIDEKI
Exec Dt:
09/07/2017
TANIGUCHI, YOSHIFUMI
Exec Dt:
09/04/2017
YAGUCHI, TOSHIE
Exec Dt:
08/30/2017
DOBASHI, TAKASHI
Exec Dt:
09/06/2017
WATANABE, KEITARO
Exec Dt:
09/04/2017
TAMAKI, HIROKAZU
Exec Dt:
09/04/2017
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
CROWELL & MORING LLP
1001 PENNSYLVANIA AVENUE NW
WASHINGTON, DC 20004
Assignment: 2
Reel/Frame:
052398/0249Recorded: 04/14/2020Pages: 14
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/12/2020
Assignee:
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
CROWELL & MORING LLP
P.O. BOX 14300
WASHINGTON, DC 20044-4300

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