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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/01/2020
Application #:
14860078
Filing Dt:
09/21/2015
Publication #:
Pub Dt:
12/22/2016
Inventors:
Marcus Musselman, Juan Valdivia III, Hua Xiang, Aaron Eppler, Andrew D. Bailey III et al
Title:
SYSTEM AND METHOD FOR DETERMINING FIELD NON-UNIFORMITIES OF A WAFER PROCESSING CHAMBER USING A WAFER PROCESSING PARAMETER
Assignment: 1
Reel/Frame:
036628/0514Recorded: 09/23/2015Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/21/2015
Exec Dt:
09/20/2015
Exec Dt:
09/18/2015
Exec Dt:
09/17/2015
Exec Dt:
09/18/2015
Exec Dt:
09/21/2015
Exec Dt:
09/18/2015
Assignee:
4650 CUSHING PARKWAY
FREMONT, CALIFORNIA 94538
Correspondent:
HARNESS, DICKEY & PIERCE, P.L.C.
P.O. BOX 828
BLOOMFIELD HILLS, MI 48303

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