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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/01/2020
Application #:
16420188
Filing Dt:
05/23/2019
Publication #:
Pub Dt:
02/06/2020
Inventors:
Po-Tsung Lin, Chien-Wen Huang, Chih-Heng Fang
Title:
SEMICONDUCTOR DEFECTS INSPECTION APPARATUS
Assignment: 1
Reel/Frame:
049326/0385Recorded: 05/31/2019Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/22/2019
Exec Dt:
05/22/2019
Exec Dt:
05/22/2019
Assignee:
10F.-1, NO.268, LIANCHENG RD., ZHONGHE DIST.,
NEW TAIPEI CITY, TAIWAN 235
Correspondent:
JCIPRNET
P.O. BOX 600 TAIPEI GUTING
TAIPEI CITY, 10099 TAIWAN

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