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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
09/22/2020
Application #:
16067860
Filing Dt:
07/03/2018
Publication #:
Pub Dt:
10/31/2019
Inventors:
Nicolas DEGRENNE, Stefan MOLLOV
Title:
METHOD AND DEVICE FOR ESTIMATING LEVEL OF DAMAGE OR LIFETIME EXPECTATION OF POWER SEMICONDUCTOR MODULE
Assignment: 1
Reel/Frame:
046269/0526Recorded: 07/05/2018Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/11/2018
Exec Dt:
06/12/2018
Assignee:
CAPRONILAAN 46
NS SCHIPHOL RIJK, NETHERLANDS NL-1119
Correspondent:
BIRCH, STEWART, KOLASCH & BIRCH, LLP
8110 GATEHOUSE ROAD, SUITE 100E
FALLS CHURCH, VA 22042
Assignment: 2
Reel/Frame:
046492/0015Recorded: 07/05/2018Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/16/2018
Assignee:
7-3, MARUNOUCHI 2-CHOME, CHIYODA-KU
TOKYO, JAPAN 100-8310
Correspondent:
BIRCH, STEWART, KOLASCH & BIRCH, LLP
8110 GATEHOUSE ROAD, SUITE 100E
FALLS CHURCH, VA 22042

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