Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/05/2021
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Application #:
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16282897
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Filing Dt:
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02/22/2019
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Publication #:
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Pub Dt:
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08/29/2019
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Inventors:
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Yuji Kohno, Akiho Nakamura
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Title:
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Method of Aberration Measurement and Electron Microscope
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-1-2 MUSASHINO, AKISHIMA |
| TOKYO, JAPAN 196-8558 |
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| THE WEBB LAW FIRM |
| 420 FT. B DUQUESNE BOULEVARD |
| ONE GATEWAY CENTER, SUITE 1200 |
| PITTSBURGH, PA 15222 |
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