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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
10971325
Issue Dt:
04/06/2021
Application #:
16567687
Filing Dt:
09/11/2019
Publication #:
20200083017
Pub Dt:
03/12/2020
Inventors:
Minoru HARADA, Yuji TAKAGI, Naoaki KONDO, Takehiro HIRAI, Yohei MINEKAWA
Title:
DEFECT OBSERVATION SYSTEM AND DEFECT OBSERVATION METHOD FOR SEMICONDUCTOR WAFER
Assignment: 1
Reel/Frame:
050776/0572Recorded: 10/21/2019Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
HARADA, MINORU
Exec Dt:
09/10/2019
TAKAGI, YUJI
Exec Dt:
09/05/2019
KONDO, NAOAKI
Exec Dt:
09/04/2019
HIRAI, TAKEHIRO
Exec Dt:
09/10/2019
MINEKAWA, YOHEI
Exec Dt:
09/06/2019
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN 105-8717
Correspondent:
ERIC G. KING
MILES & STOCKBRIDGE PC
1751 PINNACLE DRIVE, SUITE 1500
TYSONS CORNER, VA 22102
Assignment: 2
Reel/Frame:
052225/0894Recorded: 03/25/2020Pages: 15
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/14/2020
Assignee:
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME
MINATO -KU, TOKYO, JAPAN
Correspondent:
MILES & STOCKBRIDGE, P.C.
1751 PINNACLE DR.
SUITE 1500
TYSON'S CORNER, VA 22102

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