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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/13/2021
Application #:
16442379
Filing Dt:
06/14/2019
Publication #:
Pub Dt:
10/01/2020
Inventors:
Hua WANG, Zhiyong ZHANG, Weiwei DENG, Kun YU, Haiying JI, Bin LUO
Title:
HALO TEST METHOD FOR AN OPTICAL CHIP IN AN INTEGRATED CIRCUIT
Assignment: 1
Reel/Frame:
055336/0348Recorded: 02/19/2021Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/10/2019
Exec Dt:
06/10/2019
Exec Dt:
06/10/2019
Exec Dt:
06/10/2019
Exec Dt:
06/10/2019
Exec Dt:
06/10/2019
Assignee:
2ND FLOOR,BUILDING 2,NO.351 GUOSHOUJING ROAD
PUDONG NEW AREA
SHANGHAI, CHINA
Correspondent:
TONY HOM
81 70 ST
BROOKLYN, NY 11209

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