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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
10984979
Issue Dt:
04/20/2021
Application #:
16475726
Filing Dt:
07/03/2019
Publication #:
20190355549
Pub Dt:
11/21/2019
Inventors:
Shin IMAMURA, Takashi OHSHIMA, Tomonobu TSUCHIYA, Hajime KAWANO, Shahedul HOQUE et al
Title:
CHARGED PARTICLE DETECTOR AND CHARGED PARTICLE BEAM APPARATUS
Assignment: 1
Reel/Frame:
049661/0001Recorded: 07/03/2019Pages: 9
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
IMAMURA, SHIN
Exec Dt:
06/12/2019
OHSHIMA, TAKASHI
Exec Dt:
06/06/2019
TSUCHIYA, TOMONOBU
Exec Dt:
06/13/2019
KAWANO, HAJIME
Exec Dt:
06/19/2019
HOQUE, SHAHEDUL
Exec Dt:
06/06/2019
MIZUTANI, SHUNSUKE
Exec Dt:
06/10/2019
SUZUKI, MAKOTO
Exec Dt:
06/07/2019
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU,
TOKYO, JAPAN 105-8717
Correspondent:
MATTINGLY & MALUR, PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314
Assignment: 2
Reel/Frame:
052259/0227Recorded: 03/30/2020Pages: 68
Conveyance:
CHANGE OF NAME AND ADDRESS
Assignor:
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/12/2020
Assignee:
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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