Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/29/2021
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Application #:
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16318638
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Filing Dt:
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01/17/2019
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Publication #:
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Pub Dt:
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05/30/2019
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Inventors:
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Kazutaka ERIGUCHI, Shuichi SAMATA, Syun SASAKI
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Title:
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METHOD OF EVALUATING CARBON CONCENTRATION OF SILICON SAMPLE, METHOD OF EVALUATING SILICON WAFER MANUFACTURING PROCESS, METHOD OF MANUFACTURING SILICON WAFER, METHOD OF MANUFACTURING SILICON SINGLE CRYSTAL INGOT, SILICON SINGLE CRYSTAL INGOT AND SILICON WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-2-1, SHIBAURA, MINATO-KU |
| TOKYO, JAPAN 105-8634 |
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| GREENBLUM & BERNSTEIN, P.L.C. |
| 1950 ROLAND CLARKE PLACE |
| RESTON, VA 20191 |
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