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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
08/17/2021
Application #:
16984090
Filing Dt:
08/03/2020
Publication #:
Pub Dt:
11/19/2020
Inventors:
Peng-Ren CHEN, Wen-Hao CHENG, Wei-Chung HU, Jyun-Hong CHEN, Shiang-Bau WANG et al
Title:
SEMICONDUCTOR WAFER MEASUREMENT METHOD AND SYSTEM
Assignment: 1
Reel/Frame:
053388/0437Recorded: 08/03/2020Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/10/2015
Exec Dt:
09/10/2015
Exec Dt:
09/10/2015
Exec Dt:
09/16/2015
Exec Dt:
09/10/2015
Exec Dt:
09/10/2015
Exec Dt:
09/10/2015
Assignee:
NO. 8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK
HSINCHU, TAIWAN 300
Correspondent:
HAUPTMAN HAM, LLP (TSMC)
2318 MILL ROAD
SUITE 1400
ALEXANDRIA, VA 22314

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