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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
11120969
Issue Dt:
09/14/2021
Application #:
16832973
Filing Dt:
03/27/2020
Publication #:
20200227232
Pub Dt:
07/16/2020
Inventors:
Gabor Toth, Rohit Bothra, Rainer Knippelmeyer, Doug K. Masnaghetti, David Trease et al
Title:
Method and System for Charged Particle Microscopy with Improved Image Beam Stabilization and Interrogation
Assignment: 1
Reel/Frame:
052248/0793Recorded: 03/27/2020Pages: 10
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
MASNAGHETTI, DAVID K.
Exec Dt:
09/08/2016
TOTH, GABOR
Exec Dt:
11/08/2014
TREASE, DAVID
Exec Dt:
11/07/2016
BOTHRA, ROHIT
Exec Dt:
11/14/2016
CHEN, GRACE HSIU-LING
Exec Dt:
09/16/2016
KNIPPELMEYER, RAINER
Exec Dt:
10/11/2016
Assignee:
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY
SUITE 220
OMAHA, NE 68154-5299
Assignment: 2
Reel/Frame:
056136/0419Recorded: 05/04/2021Pages: 3
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
KLA-TENCOR CORPORATION
Exec Dt:
06/19/2019
Assignee:
KLA CORPORATION
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY, SUITE 220
OMAHA, NE 68154

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