Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/04/2022
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Application #:
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15998664
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Filing Dt:
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08/16/2018
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Publication #:
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Pub Dt:
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01/28/2021
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Inventors:
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Tsutomu SAKUYAMA, Yasushi NAGATA, Hiroyuki ONISHI
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Title:
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DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND PROGRAM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| TENJINKITA-MACHI 1-1, TERANOUCHI-AGARU 4-CHOME |
| HORIKAWA-DORI, KAMIGYO-KU, KYOTO-SHI |
| KYOTO, JAPAN 602-8585 |
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| TOMOKI TANIDA |
| MCDERMOTT WILL & EMERY LLP |
| 500 NORTH CAPITOL STREET, N.W. |
| WASHINGTON, DC 20001 |
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