Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
03/15/2022
|
Application #:
|
17240805
|
Filing Dt:
|
04/26/2021
|
|
Publication #:
|
|
Pub Dt:
|
09/02/2021
| | | | |
|
Inventors:
|
Yen-Liang CHEN, Hung-Chih HSIEH
|
|
Title:
|
METHOD AND APPARATUS FOR DIFFRACTION-BASED OVERLAY MEASUREMENT
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| NO. 8, LI-HSIN RD. 6, SCIENCE BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN 300 |
|
|
|
|
| MCDERMOTT WILL & EMERY LLP |
| THE MCDERMOTT BUILDING |
| 500 NORTH CAPITOL STREET |
| WASHINGTON, DC 20001 |
|
|
Search Results as of:
05/15/2024 01:33 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
